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Methods & Techniques

X-Ray

Spectroscopy
Raman
Transport Properties
Magnetotransport
Low-frequency Noise
Low Noise Measurements
Magnetic properties
SQUID Magnetometry
Torque Magnetometry
Thermodynamic properties
Specific Heat
Material Analysis
X-Ray Diffraction
AFM/STM
LEED/RHEED
SEM/EDX
Thin films & nanostructures
Lithography
Thin Film Deposition
RIE/IBE
ULT
µK System
Dilution Refrigerators
ULT Thermometry
Bulk materials
Crystal Growth

We have installed three X-ray diffractometers (Bruker D8 Advance and D8 Discover and an older Laue camera for crystal orientation).

Bruker Diffractometers

BrukerAXS D8 Discover (jpeg, 36k)

The two-circle system (right) is used for powder diffraction. In this system, the samples can be heated in oxidizing, reductive or inert atmosphere up to 1600°C. It is equipped with a Göbel mirror and a position-sensitive detector to save measuring time.

The second system is a high resolution four-circle diffractometer (left) that can be used for reciprocal space mappings. It is equipped with a Göbel mirror and an asymmetric two-fold monochromator and allows for the texture analysis of thin film superlattices and single crystalline materials. In both systems, measurements can be carried out fully computer-controlled.

BrukerAXS D8 Advance (jpeg, 55k)
Two-circle X-ray difractometer Bruker D8 Advance

Laue Camera

The older Laue system operates with white x-ray light (Bremsstrahlung) in the Laue-backscattering mode. It allows the orientation of single crystals to better than 0.5°, which can be then cut and polished in different crystal orientations.

Laue diffraction pattern (jpeg, 15k)
Laue pattern of  a c-oriented Nd2CuO4 single crystal  with 4-fold symmetry